.

Publications of Albert Theuwissen

  • 271. Accel Abarca and Albert Theuwissen : “A CMOS Image Sensor Dark Current Compensation Using In-Pixel Temperature Sensors”, Sensors 2023, Special issue on the 2023 International Image Sensor Workshop, 23(22), 9109. (download this publication)
  • 270. Albert Theuwissen : “Throwing a bomb is CIS world : reliability issues with an automotive imager”, Image Sensor Europe Conference, London, March 20-21, 2024.
  • 269. Albert Theuwissen : “Angular Dependence and Parasitic Light Sensitivity of CMOS Image Sensors”, invited talk at the 10th Fraunhofer CMOS Image Sensor Workshop, November 21-22, 2023, Duisburg (Germany).
  • 268. Albert Theuwissen : “Introduction to CMOS Image Sensors”, Day of Detection, Oct. 23-25, 2023, Padova (I).
  • 267. Albert Theuwissen : “Stacking Technology : Past, Present, Future”, EMVA Conference, October 11-12, 2023, Wageningen (NL),
  • 266. Jaekyum Lee, Albert Theuwissen : “A linearity improvement method for CIS column-parallel SAR ADC using two-step conversion”, ESSDERC, Lisbon (P), September 2023, (download this publication)
  • 265. Albert Theuwissen : “CIS Stacking Technology : Past, Present and Future”, E-Picture This Workshop, Delft (Nl), June 21, 2023,
  • 264. Sandra Kanjirakkatraveendran, Padmakumar Rao, P.M. Sherna, Hande Aydogmus, Francesco Stallone, Albert Theuwissen : “Towards the Holy Grail : CMOS-compatible, (Near-) Infrared Image Sensors”, Infrared Detection for Space Applications, Toulouse (France), June 7-9, 2023,
  • 263. Accel Abarca, Albert Theuwissen : “Dark Current Compensation of a CMOS Image Sensor by Using In-Pixel Temperature Sensors”, International Image Sensor Workshop, Edinburg (UK), May 2023, (download this publication)
  • 262. Albert Theuwissen : “Temperature Dependance of CIS Performance Parameters”, Image Sensor Europe Conference, London, March 15-16, 2023,
  • 261. Albert Theuwissen : “Past, present and future of stacked CIS”, ESSCIRC-ESSDERC Workshop “Wafer-level 3D Stacked Imagers : Technologies and Sensors Architectures”, Milano (Italy), September 19th, 2022,
  • 260. Albert Theuwissen : “''Case Study of a Global Shutter CIS – Part 2 : Parasitic Light Sensitivity”, IEEE Transactions on Electron Devices, June 202 (download this publication)
  • 259. Albert Theuwissen : “Case Study of a Global Shutter CIS - Part 1 : Angular Dependency of the Light Sensitivity”, IEEE Transactions on Electron Devices, June 2022, (download this publication)
  • 258. Albert Theuwissen : “Angular Light Sensitivity and Shutter Efficiency”, Image Sensor Europe Conference, London, May 9-10, 2022,
  • 257. Jaekyum Lee, Albert Theuwissen : “An offset calibration technique for CIS column parallel SAR ADC using memory”, Electronic Imaging, San Francisco, 2022,
  • 256. Albert Theuwissen, Guy Meynants : “Welcome to the World of Single-Slope Column-Level Analog-to-Digital Converters for CMOS Image Sensors”, published in Foundations and Trends in Integrated Circuits and Systems, Vol. 1, Issue 1, ISSN: 2693-9347, 2021.
  • 255. Weihan Hu, Albert Theuwissen : “A Multi-Junction Photodetector with Dual Four Transistor Structure to Detect Visible and Near-infrared Light in One Single Pixel”, IISW 2021, September 20-23, 2021,
  • 254. Liqiang Han, Albert J.P. Theuwissen : “A Deep Sub-Electron Temporal Noise CMOS Image Sensor with Adjustable Sinc-type Filter to Achieve Photon Counting Capability”, IEEE Solid-State Circuit Letters, Vol. 4, 2021, (download this publication)
  • 253. Albert Theuwissen : “There’s More To The Picture Than Meets The Eye”, Plenary Talk at the International Solid-State Circuits Conference, San Francisco, February 13-21, 2021, (https://www.youtube.com/watch?v=TDYqIJFREQ4&t=419s) (download this publication)
  • 252. Albert Theuwissen : “Deep Trench Isolation : the Holy Grail for CMOS Image Sensors ?”, keynote talk at Electronic Imaging, San Francisco, January 18-21, 2021,
  • 251. Albert Theuwissen : “Deep Trench Isolation is Here to Stay”, keynote talk at IEEE Sensors, Rotterdam, October 25-28, 2020, (https://www.youtube.com/watch?v=d_B-T7JmGQE&t=23s)
  • 250. Shuang Xie and Albert Theuwissen : “A CMOS Image Sensor with Thermal Sensing Capability and Column Zoom ADCs”, IEEE Sensors Journal, Vol. 20, 2020, pp. 2398-2404,
  • 249. Shuang Xie and Albert Theuwissen : “Suppression of Spatial and Temporal Noise in a CMOS Image Sensor”, IEEE Sensors Journal, Vol. 20, 2020, pp. 162-170,
  • 248. Shuang Xie and Albert Theuwissen : “A CMOS image sensor with a 10 MHz continuous column readout speed using digitally calibrated pipelined ADCs”, Microelectronics Journal, Vol.99, 2020, doi.org/10.1016/j.mejo.2020.104758,
  • 247. Albert Theuwissen : “Deep Trench Isolation is Here to Stay”, invited talk at Image Sensors Europe Conference, London, March 11-12, 2020,
  • 246. Jaekyum Lee, Albert Theuwissen : “10b 1MS/s column parallel SAR ADC for high speed CMOS image sensors with offset compensation technique using analog summation method”, Scientific CMOS Image Sensors Workshop, Toulouse, 26-27 November 2019,
  • 245. Albert Theuwissen : “Deep Trench Isolation is Here to Stay”, invited talk a 73rd Heidelberger Bildverarbeitungsforum, Stuttgart, Oct 1st, 2019,
  • 244. Shuang Xie, Albert Theuwissen : “A 10 bit 5 MS/s column SAR ADC with digital error correction for CMOS image sensors”, ISCAS 2019, 26-29 May, Sapporo Japan. (download this publication)
  • 243. Shuang Xie, Xiaoliang Ge, Albert Theuwissen : “Temperature Sensors Incorporated into a CMOS Image Sensor with Column Zoom ADCs”, ISCAS 2019, 26-29 May, Sapporo Japan. (download this publication)
  • 242. Shuang Xie and Albert Theuwissen : “On-Chip Smart Temperature Sensors for Dark Current Compensation in CMOS Image Sensors”, IEEE Sensors Journal, 2019, Vol. 19, pp. 7849-7860. (download this publication)
  • 241. S. Xie and A. Theuwissen : “All-MOS self-referenced temperature sensor”, Electronics Letters, Vol. 55, 2019, pp. 1045-1046. (download this publication)
  • 240. Shuang Xie and Albert Theuwissen : “A CMOS-Imager-Pixel-Based Temperature Sensor for Dark Current Compensation”, IEEE Transactions on Circuits and Systems II, 2019, (download this publication)
  • 239. Shuang Xie and Albert Theuwissen : “Suppression of spatial and temporal noise in a CMOS image sensor”, IEEE Sensors Journal, 2019, (download this publication)
  • 238. Shuang Xie, Accel Abarca Prouza and Albert Theuwissen : “CMOS-Imager-Pixel-Based Temperature Sensor for Dark Current Compensation”, IEEE Transactions on Circuits and Systems II, 2019,
  • 237. Shuang Xie, Accel Abarca Prouza and Albert Theuwissen : “A CMOS Image Sensor with In-Pixel Temperature Sensors for Dark Signal Non-Uniformity Compensation”, IISW 2019, Snow Bird (Utah, USA), June 24-27, 2019,
  • 236. Shuang Xie, Xiaoliang Ge and Albert Theuwissen : “A CMOS Image Sensor with Improved Readout Speed using Column SAR ADC with Digital Error Correction”, IEEE ISCAS 2019, Sapporo (Japan), May 26-29, 2019, (download this publication)
  • 235. Shuang Xie and Albert Theuwissen : “Temperature Sensors Incorporated into a CMOS Image Sensor with Column Zoom ADCs”, Award winning best paper at IEEE ISCAS 2019, Sapporo (Japan), May 26-29, 2019,
  • 234. Albert Theuwissen : “Datasheets vs. Real Performance of CMOS Image Sensors”, invited talk at the 9th Fraunhofer CMOS Image Sensor Workshop, May 8-9, 2019, Duisburg (Germany)
  • 233. Shuang Xie, Albert Theuwissen : “Compensation for Process and Temperature Dependency in a CMOS Image Sensor”, Sensors, Vol. 19, 870, 2019, pp. 1-14, (download this publication)
  • 232. Fei Wang, Albert J.P. Theuwissen : “Pixel Optimizations and Digital Calibration Methods of a CMOS Image Sensor Targeting High Linearity” IEEE Transactions on Circuits and Systems, 2018. (download this publication)
  • 231. Fei Wang, Liqiang Han, Albert Theuwissen : “Development and evaluation of a highly linear CMOS image sensor with a digitally assisted linearity-calibration”, IEEE Journal of Solid-State Circuits, Vol. 53, Oct. 2018, pp. 2970-2981, (download this publication)
  • 230. Fei Wang, Albert Theuwissen : “Temperature effect on the linearity performance of a CMOS image sensor”, IEEE Sensors Letters, Vol. 2, pp. 1-4, September 2018, (download this publication)
  • 229. Albert Theuwissen : “From Smart to Smarter : Recent Developments in CMOS Image Sensors”, invited talk at Smart System Integration Conference, Dresden, April 12, 2018,
  • 228. Albert Theuwissen : “Data Sheets versus Real Performance”, invited talk at PHAER Vision Expert Day, Ghent, March 26, 2018,
  • 227. Albert Theuwissen : “Fundamentals of Noise in Image Sensors”, invited talk at PHAER Vision Expert Day, Ghent, March 26, 2018,
  • 226. Albert Theuwissen : “Why Hybrid Image Sensor have a hard time to beat Monolithic CMOS Image Sensors”, Image Sensors Europe, London (UK), March 14-15, 2018,
  • 225. Xiaoliang Ge and Albert Theuwissen : “Temporal Noise Analysis of Charge-domain Sampling readout Circuits for CMOS Image Sensor”, Sensors, open access http://www.mdpi.com/1424-8220/18/3/707 (download this publication)
  • 224. Fei Wang and Albert Theuwissen : “Two calibration methods to improve the linearity of a CMOS Image Sensor”, Electronic Imaging, San Francisco, 2018. (download this publication)
  • 223. Xiaoliang Ge, Albert Theuwissen : “A 0.5e Temporal Noise CMOS Image Sensor with Gm-Cell-Based Pixel and Period-Controlled Variable Conversion Gain”, IEEE Transactions on Electron Devices, Dec. 2017, pp. 5019-5026, (download this publication)
  • 222. Fei Wang and Albert Theuwissen : “Techniques for Pixel-Level Linearity Optimization”, Workshop on CMOS Image Sensors for High-Performance Applications, Toulouse, November 2017,
  • 221. S. Xie, A. Abarca, J. Markenhof, X. Ge, A. Theuwissen : “Analysis and calibration of process variations for an array of temperature sensors”, IEEE Sensors Conference, Glasgow (United Kingdom), Oct 30-Nov 1, 2017, (download this publication)
  • 220. Albert Theuwissen : “Recent Developments in CMOS Image Sensors”, invited talk at 2nd EMVA Forum, Sept. 6-8, Vienna (Austria),
  • 219. Accel Abarca, Shuang Xie, Jules Markenhof, Albert Theuwissen : “Temperature Sensors Integrated into a CMOS Image Sensor”, Proceedings of Eurosensors, p.358, Paris, Sept. 3-6, 2017. See also : Sensors, open access http://www.mdpi.com/2504-3900/1/4/358/pdf, (download this publication)
  • 218. Albert Theuwissen : “CMOS Image Sensors : Masterpieces of 3D Integration”, Invited talk at Schleswig-Holsteinischen Bildverarbeitungstagen 2017, Ahrensburg (Germany), June 8th, 2017,
  • 217. Fei Wang, Liqiang Han, Albert Theuwissen : “A Highly Linear CMOS Image Sensor with a Digitally Assisted Linearity Calibration Method”, 2017 International Image Sensor Workshop, Hiroshima (Japan), May 30- June 2, 2017, pp. 336-369, (download this publication)
  • 216. Xiaoliang Ge, Albert Theuwissen : “A 0.5e- Temporal Noise CMOS Image Sensor with Charge-Domain CDS and Period-Controlled Variable Conversion Gain”, 2017 International Image Sensor Workshop, Hiroshima (Japan), May 30- June 2, 2017, pp. 290-293, (download this publication)
  • 215. Eric R. Fossum, Nobukazu Teranishi, Albert Theuwissen, David Stoppa, Edoardo Charbon, editors : “Photon-Counting Image Sensors”, MDPI, ISBN 978-3-03842-374-4, 2017,
  • 214. Albert Theuwissen : “NOISE : You Love It or You Hate It”, Webinar IEEE-SSCS, recorded February 6, 2017.
  • 213. Fei Wang, Albert Theuwissen : “Linearity analysis of a CMOS image sensor”, Electronic Imaging, San Francisco, Jan. 30 - Feb. 2, 2017. (download this publication)
  • 212. Albert Theuwissen : “CMOS Image Sensors : Masterpieces of 3D Integration”, Invited talk at the University of Leuven (Belgium), Nov. 15th, 2016,
  • 211. Xiaoliang Ge, Albert Theuwissen : “A CMOS image sensor with nearly unity-gain source follower and optimized column amplifier”, 2016 IEEE Sensors, Oct. 20 - Nov. 3, 2016. (download this publication)
  • 210. Albert Theuwissen : “Noise : You Love It or You Hate It”, Invited talk at the University of Varna (Bulgaria), Oct. 21st, 2016.
  • 209. Albert Theuwissen : “What Shall I Do With All These Pixels ?”, Invited talk at the EMVA Conference, Edinburgh, June 2016.
  • 208. Mukul Sarkar, Bernhard Buettgen, Albert Theuwissen : “Temperature Effects on Feedforward Voltage in Standard CMOS Pinned Photodiodes”, IEEE Transactions on Electron Devices, Vol. 63, pp. 1963-1968, May 2016. (download this publication)
  • 207. Albert Theuwissen : “CMOS Image Sensors : Masterpieces of 3D integration”, invited talk at the 6th Fraunhofer CMOS Image Sensor Workshop, May 9-10, 2016, Duisburg (Germany).
  • 206. Albert Theuwissen : “CMOS Image Sensors : Masterpieces of 3D integration”, invited talk at the Norwegian Electro-Optical Meeting, Voss (Norway), April 13-15, 2016.
  • 205. Albert Theuwissen : “CMOS Image Sensors : Masterpieces of 3D integration”, invited talk at the workshop “Smart Sensors”, Delft University of Technology, March 24th, 2016.
  • 204. Xiaoliang Ge, Bastien Mamdy, Albert Theuwissen : “A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique”, Electronic Imaging, San Francisco, Feb. 14-18, 2016, (download this publication)
  • 203. Albert Theuwissen : “Noise : You Love It or You Hate It”, Invited talk at the ISSCC Forum “Advanced IC Design for Ultra-Low-Noise Sensing”, San Francisco, Feb. 4th, 2016,
  • 202. Y. Xu, X. Ge, A.J.P. Theuwissen : “A Potential-Based Characterization of the Transfer Gate in CMOS Image Sensors”, IEEE Transactions on Electron Devices, Vol. 63, pp. 42-48, 2016, (download this publication)
  • 201. L. Han, S. Yao, A.J.P. Theuwissen : “A Charge Transfer Model for CMOS Image Sensors”, IEEE Transactions on Electron Devices, Vol. 63, pp. 32-41, 2016, (download this publication)
  • 200. Albert Theuwissen : “CMOS Imagers Today and Tomorrow : Highlights of the IISW2015”, keynote at the SEMI Conference “Imaging Everywhere”, Oct. 6-7, 2015, Dresden (Germany).
  • 199. Kazuya Kitamura, Albert Theuwissen : “A Two Conversions/Sample Differential Slope Multiple Sampling ADC With Accelerated Counter Architecture”, 2015 International Image Sensor Workshop, Vaals (the Netherlands), June 2015, pp. 417-420, (download this publication)
  • 198. Yang Xu, Xiaoliang Ge, Albert Theuwissen : “Investigating Transfer Gate Potential Barrier by Fee-Forward Effect Measurement”, 2015 International Image Sensor Workshop, Vaals (the Netherlands), June 2015, pp. 116-119, (download this publication)
  • 197. Albert Theuwissen : “CMOS Image Sensors”, in “Smart Sensor Systems : Emerging Technologies and Applications”, Edited by G. Meijer, M. Pertijs and K. Makinwa, John Wiley & Sons, 2014, pp. 173-189,
  • 196. Albert Theuwissen : “What on Earth Shall I Do with All These Pixels ?”, invited talk at the workshop “Time and Complexity in Imaging”, Delft University of Technology, July 1st, 2014.
  • 195. Albert Theuwissen : “The Pinned Photodiode”, Invited talk at the 7th Fraunhofer CMOS Image Sensor Workshop, Mey 20-21, 2014, Duisburg (Germany).
  • 194. M. Sarkar and A.J.P. Theuwissen : “Integrated polarization analyzing CMOS image sensors for detection and signal processing”, in “Smart sensors and MEMS”, edited by S. Nihtianov and A. Luque, Woodhead Publishing, 2014, pp.124-152,
  • 193. Ning Xie and Albert Theuwissen : “A Miniaturized Micro-Digital Sun Sensor by Means of Low-Power Low-Noise CMOS Imager”, IEEE Sensors Journal, Vol. 14, Jan. 2014, pp. 96-103,
  • 192. Ning Xie, Albert J.P. Theuwissen : “Low-power high-accuracy micro-digital sun sensor by means of a CMOS image sensor”, Journal of Electronic Imaging 22(3), 033030, Jul-Sep 2013, (download this publication)
  • 191. Yang Xu, Albert Theuwissen : “Image Lag Analysis and Photodiode Shape Optimization of 4T CMOS Pixels”, 2013 International Image Sensor Workshop,Snowbird (UT), June 2013, (download this publication)
  • 190. Mukul Sarkar, Bernhard Buettgen, Albert Theuwissen : “Feed-Forward Voltage in CMOS Pinned Photodiodes”, 2013 International Image Sensor Workshop,Snowbird (UT), June 2013, (download this publication)
  • 189. Mukul Sarkar, Bernhard Buettgen, Albert Theuwissen : “Feedforward Effect in Standard CMOS Pinned Photodiodes”, IEEE Transactions on Electron Devices, Vol. 60, March 2013, pp. 1154-1161, (download this publication)
  • 188. Mukul Sarkar and Albert Theuwissen : “A Biologically Inspired CMOS Image Sensor”, Springer, ISBN 978-3-642-34901-0, 2013,
  • 187. Mukul Sarkar, David San Segundo Bello, Chris van Hoof, Albert Theuwissen : “Biologically Inspired CMOS Image Sensor for Fast Motion and Polarization Detection”, IEEE Sensors Journal, Vol. 13, 2013, pp. 1065-1073, (download this publication)
  • 186. N. Xie, A.J.P. Theuwissen : “An Autonomous Microdigital Sun Sensor by a CMOS Imager in Space Application”, IEEE Transactions on Electron Devices, vol. ED-59, pp.3405-3410, Dec. 2012, (download this publication)
  • 185. Jiaming Tan, Albert Theuwissen : “Investigation of X-ray Damage Effects on 4T CMOS Image Sensors”, 2012 International Semiconductor Conference Dresden-Grenoble, Sept. 24-26, Grenoble (France). (download this publication)
  • 184. Bart de Boer, M. Durkut, J. Leijtens, E. Laan, A. Theuwissen, N. Xie, H. Hakkesteegt, E. Urquijo, P. Bruins : “Mini DSS : A low-power and high-precision miniaturized digital sun sensor”, International Conference on Space Optics, Oct. 9-12, 2012, Ajaccio (Corse),
  • 183. Albert Theuwissen : “Past, Present and Future of CMOS Image Sensors”, Invited talk at the 14th International Workshop on Radiation Imaging Detectors”, July 1-5, 2012, Figuera da Foz (Portugal),
  • 182. Jiaming Tan, Bernhard Buettgen, Albert Theuwissen : “Analyzing the Radiation Degradation of 4-Transistor Deep Submicron Technology CMOS Image Sensors”, IEEE Sensors Journal, Vol. 12, No. 6, June 2012, p. 2278-2286. (download this publication)
  • 181. Albert Theuwissen : “Imagers getting worse, images getting better”, Invited talk at the 6th Fraunhofer CMOS Image Sensor Workshop, June 12-13, 2012, Duisburg (Germany),
  • 180. Albert Theuwissen : “Trends in image sensors”, (invited talk), SPIE Photonics Europe Conference, April 16-19, 2012, Brussels.
  • 179. Yue Chen, Yang Xu, Adri Mierop and Albert J.P. Theuwissen : “Column-Parallel Digital Correlated Multiple Sampling for Low-Noise CMOS Image Sensors”, IEEE Sensors Journal, April 2012, pp. 793-799, (download this publication)
  • 178. Yue Chen, Yang Xu, Youngcheol Chae, Adri Mierop, Xinyang Wang, Albert Theuwissen : “A 0.7 e-rms Temporal Readout Noise CMOS Image Sensor for Low-Light_Level Imaging”, ISSCC, San Francisco, Digest Tech. Papers, p. 384-385, Febr. 19-23, 2012. (download this publication)
  • 177. Yang Xu, Adri Mierop and Albert Theuwissen : “Charge Domain Interlace Scan Implementation in a CMOS Image Sensor”, IEEE Sensors Journal, Vol. 11, November 2011, pp. 2621-2627, (download this publication)
  • 176. Mukul Sarkar, David San Segundo Bello, Chris van Hoof, Albert Theuwissen : “A Biologically Inspired CMOS Image Sensor for Polarization and Fast Motion Detection”, IEEE Sensors, Oct. 28-31, 2011, Limerick (Ireland), pp. 825-828, (download this publication)
  • 175. Peter Seitz and Albert Theuwissen, editors : “Single-Photon Imaging”, Springer, ISBN 978-3-642-18442-0, 2011, (download this publication)
  • 174. Yue Chen, Jiaming Tan, Xinyang Wang, Adri Mierop and Albert Theuwissen : “X-Ray Radiation Effect on CMOS Imagers with In-Pixel Buried-Channel Source Follower”, ESSDERC, Sept. 12-16, 2011, Helsinki (Finland), (download this publication)
  • 173. Yue Chen, Albert Theuwissen and Youngcheol Chae : “Column-Parallel Single Slope ADC with Digital Correlated Multiple Sampling for Low Noise CMOS Image Sensors”, Eurosensors XXV, Sept. 4-7, 2011, Athens (Greece), (download this publication)
  • 172. Mukul Sarkar, David San Segundo Bello, Chris van Hoof, Albert Theuwissen : “Integrated Polarization-Analyzing CMOS Image Sensor for Detecting Incoming Light Ray Direction”, IEEE Transactions On Instrumentation and Measurement, Vol. 60, August 2011, pp. 2759-2767, (download this publication)
  • 171. Mukul Sarkar, David San Segundo Bello, Chris van Hoof, Albert Theuwissen : “Integrated Polarization Analyzing CMOS Image Sensor for Real Time Material Classification”, IEEE Sensors Journal, vol. 11, August 2011, pp. 1692-1703. (download this publication)
  • 170. Gayathri G. Nampoothiri, Albert Theuwissen : “Ageing Effects on Image Sensors : Neutron Irradiation Studies on Wafer and Packaged CCD and CMOS devices”, The Nuclear and Space Radiation Effects Conference, July 25-29, 2011, Las Vegas (NV),
  • 169. Albert Theuwissen : “Cosmic Ray Damage in Solid-State Imagers”, invited talk at Caeleste Seminar on X-ray Detection and Radiation Hardness, June 17th, 2011, Antwerp (Belgium),
  • 168. C. Ma, D. San Segundo Bello, C. van Hoof, A. Theuwissen : “High dynamic range hybrid pixel sensor, Electronic Letters, 9th June, 2011. (download this publication)
  • 167. C.W. de Boom, M. Durkut, B.M. de Boer, H. Hakkesteegt, J.L. Leijtens, A. Theuwissen, N. Xie : “Mini-DSS : Miniaturized High-Precision Sun-Angle Measurement”, 8th Intern. ESA Conf. on Guidance, Navigation & Control Systems, 5-10 June 2011, Karlovy Vary, (Czech Republic),
  • 166. Jiaming Tan, Bernhard Buettgen, Albert Theuwissen : “4T CMOS Image Sensor Pixel Degradation due to X-ray Radiation”, 2011 International Image Sensor Workshop, Hakodate-Hokkaido (Japan), pp. 228-231, (download this publication)
  • 165. Ning Xie, Albert Theuwissen, Bernhard Buettgen : “An Autonomous micro-Digital Sun Sensor Implemented with a CMOS Image Sensor Achieving 0.004o Resolution @ 21 mW”, 2011 International Image Sensor Workshop, Hakodate-Hokkaido (Japan), pp. 208-211, (download this publication)
  • 164. Yue Chen, Yang Xu, Adri Mierop and Albert Theuwissen : “Column-Parallel Circuits with Digital Correlated Multiple Sampling for Low Noise CMOS Imagers”, 2011 International Image Sensor Workshop, Hakodate-Hokkaido (Japan), pp.78-81, (download this publication)
  • 163. Gayathri G. Nampoothiri, Albert Theuwissen : “Aging Effects on Image Sensors : Neutron Irradiation Studies on Wafer and Packaged Devices”, 2011 International Image Sensor Workshop, Hakodate-Hokkaido (Japan), pp. 66-69, (download this publication)
  • 162. Ning Xie, Albert Theuwissen : “An autonomous low power high resolution micro-digital sun sensor”, International Symposium on Photoelectric Detection and Imaging”, Beijing, May 24-26, 2011, (download this publication)
  • 161. Albert Theuwissen : “Image Sensor Noise : You love it or You hate it !”, Electronic Imaging 2011, San Francisco, SPIE Proc. 7875, January 2011,
  • 160. G. Gangadharan Nampoothiri, A.J.P. Theuwissen, M. Horemans : “Aging effects on image sensors due to terrestrial cosmic radiation”, Electronic Imaging 2011, San Francisco, SPIE Proc. 7875, January 2011, (download this publication)
  • 159. J. Tan and Albert Theuwissen : “Total Ionizing Effects on 4-Transistor CMOS Image Sensor Pixels”, 2010 International Conference on Electron Devices and Solid-State Circuits, Dec. 15-17, 2010, Hong Kong, (download this publication)
  • 158. Albert Theuwissen : “Noise : You love it or You hate it”, Invited talk at “Imaging Waves, Photons and Particles : A VLSI Design Perspective”, Dec. 1st, 2010, Delft, the Netherlands,
  • 157. Mukul Sarkar, David San Segundo Bello, Chris van Hoof, Albert Theuwissen : “A biologically inspired collision detection algorithm using differential optic flow imaging”, BIOCAS, Paphos (Cyprus), 3-5 Nov. 2010, (download this publication)
  • 156. Yue Chen, Jiaming Tan, Xinyang Wang, Adri Mierop, Albert Theuwissen : “In-Pixel Buried-Channel Source Follower in CMOS Image Sensors Exposed to X-ray Radiation”, IEEE Sensors 2010, Nov. 1-4, 2010, Hawaii, (download this publication)
  • 155. Yang Xu, Adri Mierop, Albert Theuwissen : "A CMOS Image Sensor with Charge Domain Interlace Scan”, IEEE Sensors 2010, Nov. 1-4, 2010, Hawaii, (download this publication)
  • 154. J. Tan, B. Buttgen, A.J.P. Theuwissen : “Radiation Effects on CMOS Image Sensors due to X-Rays”, International Conference on Advanced Semiconductor Devices & Mircrosystems, Oct. 25-27, 2010, Smolenice (Slovakia), (download this publication)
  • 153. Ning Xie, Albert Theuwissen, Bernard Buettgen, Henk Hakkesteegt, Henk Jansen, Johan Leijtens : “The APS+ : an intelligent active pixel sensor centered on low power”, International Conference on Space Optics, Oct. 4-8, 2010, Rhodes (Greece), (download this publication)
  • 152. Johan Leijtens, K. de Boom, M. Durkut, H. Hakkesteegt, A. Theuwissen, N. Xie : “Now is the time for the sunsensor of the future”, International Conference on Space Optics”, Oct. 4-8, 2010, Rhodes (Greece), (download this publication)
  • 151. Albert Theuwissen : “Sensors getting worse, images getting better”, DFPh Symposium, Photokina, Sept. 24th, 2010, Cologne (Germany), (download this publication)
  • 150. J. Tan, B. Buttgen, A.J.P. Theuwissen : “X-ray Radiation Effects on CMOS Image Sensor In-Pixel Devices”, 2010 International Conference on Solid-State Devices and Materials, Sept. 22-24, 2010, P-3-24, Tokyo (Japan), (download this publication)
  • 149. Mukul Sarkar, David San Segundo Bello, Chris van Hoof, Albert Theuwissen : “Biologically Inspired Autonomous Agent Navigation Using an Integrated Polarization Analyzing CMOS Image Sensor”, Eurosensors, Linz, Austria. (download this publication)
  • 148. Johan Leijtens, Ning Xie, Albert Theuwissen : “The APS+ and why we dare going without DARE”, 3rd International Workshop on Analog and Mixed Signal Integrated Circuits for Space Applications, Sept. 5-7, 2010, Noordwijk (Netherlands), (download this publication)
  • 147. Mukul Sarkar, David San Segundo Bello, Chris van Hoof, Albert Theuwissen : “Integrated polarization analyzing CMOS image sensor for autonomous navigation using polarized light”, IEEE Conference on Intelligent Systems, London, July 7-9, 2010, (download this publication)
  • 146. Ning Xie, Albert Theuwissen, Bernard Buettgen, Henk Hakkesteegt, Henk Jansen, Johan Leijtens : “Micro-Digital Sun Sensor : an Imaging Sensor for Space Applications”, IEEE International Symposium on Industrial Electronics, July 4-7, 2010, Bari (Italy), (download this publication)
  • 145. Mukul Sarkar, David San Segundo Bello, Chris van Hoof, Albert Theuwissen : “An analog and digital representation of polarization using CMOS image sensors”, 5th EOS Topical Meeting on Advanced Imaging Techniques, June 29 - July 2, 2010, Engelberg (CH), (download this publication)
  • 144. Albert Theuwissen : “Better Pictures Through Physics : the state of the art of CMOS image sensors.”, IEEE Solid-State Circuits Magazine, Spring 2010, pp. 22-28, (download this publication)
  • 143. Mukul Sarkar, David San Segundo Bello, Chris van Hoof, Albert Theuwissen : "Integrated polarization analyzing CMOS image sensor", Proceedings IEEE International Symposium on Circuits and Systems, may 30 - June 2, 2010, Paris, (download this publication)
  • 142. Albert Theuwissen : “Noise, You Like It or You Hate It”, Invited talk at the 5th Fraunhofer CMOS Image Sensor Workshop, May 5-6, 2012, Duisburg (Germany),
  • 141. Mukul Sarkar, David San Segundo Bello, Chris van Hoof, Albert Theuwissen : "Integrated Polarization-Analyzing CMOS Image Sensor for Detecting Incoming Light Ray Direction", Proceedings IEEE Sensor Application Symposium, Feb. 23-25, 2010, pp. 194-199, (download this publication)
  • 140. Albert Theuwissen : “Back-Side Illumination : state of the art and future perspectives”, Invited talk at “Sensors and Sensor Networks : A VLSI Design Perspective”, Dec. 7th, 2009, Delft, the Netherlands,
  • 139. Albert Theuwissen : “The 2009 Nobel Prize in Physics : W. Boyle and G. Smith for the CCD”, Europhysics News, Vol. 40/6, 2009, pp. 12-13, (download this publication)
  • 138. Yue Chen, Xinyang Wang, Adri J. Mierop, Albert J.P. Theuwissen : “A CMOS Image Sensor With In-Pixel Buried-Channel Source Follower and Optimized row Selector”, IEEE Transac. Electron Devices, Vol. 56, Nov. 2009, pp. 2390-2397, (download this publication)
  • 137. Albert Theuwissen : “Colour Processing”, invited talk at Universidade Federal de Minas Gerais, November 26th, 2010,
  • 136. Albert Theuwissen : “CMOS Image Sensors : Past, Present and Future”, invited talk at Universidade Federal de Minas Gerais, November 26th, 2010,
  • 135. Albert Theuwissen : “Colour Processing”, invited talk at Universidade Federal do Rio de Janeiro, November 24th, 2010,
  • 134. Albert Theuwissen : “CMOS Image Sensors : Past, Present and Future”, invited talk at Universidade Federal do Rio de Janeiro, November 24th, 2010,
  • 133. J. Leijtens, M. ter Brake, H. Derking, A. Theuwissen, N. Xie : “Can microcooling open-up new applications for the digital sunsensor chip APS+ ?”, poster at MicroNano Conference, Nov. 5-6, 2009, Delft (the Netherlands), (download this publication)
  • 132. Albert H. Westra, Jan W.T. Heemskerk, Marc A.N. Korevaar, Albert J.P. Theuwissen, Rob Kreuger, Kees M. Ligtvoet, Freek J. Beekman : “On-chip pixel binning in photon-counting CCD-based gamma camera : a powerful tool for noise reduction”, IEEE Transac. Nuclear Science, Vol. 56, Oct. 2009, pp. 2559-2565, (download this publication)
  • 131. Yue Chen, Xinyang Wang, Adri J. Mierop, Albert J.P. Theuwissen : “Characterization of In-Pixel Buried-Channel Source Follower with Optimized Row Selector in CMOS Image Sensors”, 2009 International Image Sensor Workshop, June 26-28, 2009, Bergen (Norway), (download this publication)
  • 130. Gayathri G. Nampoothiri and Albert J.P. Theuwissen : “Investigating the Ageing Effects on Image Sensors due to Terrestrial Cosmic Radiation”, Award winning poster at 2009 International Image Sensor Workshop, June 26-28, 2009, Bergen (Norway), (download this publication)
  • 129. Albert Theuwissen : “Terrestrial Cosmic Rays Influence on the Reliability of Solid-State Imagers”, invited talk at Intertech PIRA Conference on Image Sensors, London (UK), March 24-26, 2009,
  • 128. Albert J.P. Theuwissen : “CMOS Image Sensors : Yesterday, Today and Tomorrow”, invited dinner speech at SAFE & ProRISC Workshop, Koningshof, Veldhoven (the Netherlands), Nov. 27-28, 2008.
  • 127. Ning Xie, Albert J.P. Theuwissen, Xinyang Wang : “A CMOS Image Sensor with Row and Column Profiling Means”, IEEE Sensors 2008 Conference, Oct. 26-29, 2008, Lecce (Italy), pp. 1356-1359. (download this publication)
  • 126. Padmakumar R. Rao, Xinyang Wang, Albert J.P. Theuwissen : “Degradation of CMOS image sensors in deep-submicron technology due to gamma-radiation”, Solid-State Electronics, Vol. 52, 2008, pp. 1407-1413 (download this publication)
  • 125. Albert J.P. Theuwissen : “CMOS Image Sensors : State-of-the-art”, Solid-State Electronics, Vol. 52, 2008, pp. 1401-1406 (download this publication)
  • 124. Albert J.P. Theuwissen : "Influence of Terrestrial Cosmic Rays on the Reliability of CCD Image Sensors, Part 2 : Experiments at Elevated Temperature", IEEE Transactions on Electron Devices, Vol. ED-55, Sept. 2008, pp. 2324-2328. (download this publication)
  • 123. Martijn Snoeij, Albert Theuwissen, Johan Huijsing and Kofi Makinwa : “Power and Area Efficient Column-Parallel ADC Architectures for CMOS Image Sensors”, Invited talk at the 4th Fraunhofer CMOS Image Sensor Workshop, May 6-7, 2008, Duisburg (Germany). (download this publication)
  • 122. Bongki Mheen, Young-Joo Song and Albert J.P. Theuwissen : “Negative Offset Operation of 4-Transistor CMOS Image Pixel for Increased Well Capacity and Suppressed Dark Current”, IEEE Electron Device Letters, Vol. 29, April 2008, pp. 347-349 (download this publication)
  • 121. Padmakumar R. Rao, Xinyang Wang and A.J.P. Theuwissen : “CCD structures implemented in standard 0.18 µm CMOS technology”, Electronic Letters, Vol. 44, p. 548-549, April 2008 (download this publication)
  • 120. Albert J.P. Theuwissen : “Working Principle and Technology of Solid-State Image Sensors”, tutorial at Intertech Pira Conference on Image Sensors, March 18, 2008, London (UK)
  • 119. Xinyang Wang, Martijn F. Snoeij, Padmakumar R. Rao, Adri Mierop and Albert J.P. Theuwissen : “A CMOS Image Sensor with a Buried-Channel Source Follower”, ISSCC, San Francisco, Digest Tech. Papers, p.62-63, Febr. 3-7, 2008 (download this publication)
  • 118. Albert J.P. Theuwissen : “Influence of terrestrial cosmic rays on the reliability of CCD image sensors”, Electronic Imaging '08, San Jose, Jan. 26-31, 2008
  • 117. Albert J.P. Theuwissen : “Influence of Terrestrial Cosmic Rays on the Reliability of Solid-State Image Sensors, Part I : Storage at Room Temperature”, IEEE Transactions on Electron Devices, Vol. ED-54, Dec. 2007, pp. 3260-3266 (download this publication)
  • 116. Martijn Snoeij, Albert J.P. Theuwissen, Kofi A.A. Makinwa, Johan H. Huising : “Multiple-Ramp Column Parallel ADC Architectures for CMOS Image Sensors”, IEEE Journal of Solid-State Circuits, Vol. 42, no. 12, pp. 2968-2977 (download this publication)
  • 115. Padmakumar Rao, Xinyang Wang, Albert Theuwissen : “Degradation of dark current and quantum efficiency of deep sub-micron CMOS imagers under the influence of g-irradiation”, ESSDERC, Munich, Sept. 11-13, 2007 (download this publication)
  • 114. Albert Theuwissen : “CMOS Image Sensors : State-of-the-Art and Future Perspectives”, invited talk, ESSCIRC-ESSDERC, Munich, Sept. 11-13, 2007 (download this publication)
  • 113. Johan Leijtens, Albert Theuwisen, Padmakumar Rao, Xinyang Wang, Ning Xie : “Active pixel sensors : the sensor of choice for future space applications”, SPIE Europe Remote Sensing Conf., Florence (Italy), Sept. 17-20, 2007 (download this publication)
  • 112. Martijn Snoeij, Kofi Makinwa, Albert Theuwissen and Johan Huijsing : “A Power and Area Efficient Column-Parallel ADC Architecture for CMOS Image Sensors”, IEEE Sensors, Atlanta, Oct. 28-31, 2007. (download this publication)
  • 111. Albert J.P. Theuwissen : “Frontiers in Imaging”, invited keynote speech, EOS Conference on Frontiers in Imaging, June 18-19, 2007, Munich.
  • 110. Padmakumar Rao, Xinyang Wang, Adri J. Mierop and Albert J.P. Theuwissen : “Gamma-Ray Irradiation Effects on CMOS Image Sensors in Deep Sub-Micron Technology”, 2007 International Image Sensor Workshop, June 7-10, 2007, Ogunquit (Maine). (download this publication)
  • 109. Xinyang Wang, Padmakumar R. Rao, Albert J.P. Theuwissen : “Characterization of Buried Channel n-MOST Source Followers in CMOS Image Sensors”, 2007 International Image Sensor Workshop, June 7-10, 2007, Ogunquit (Maine). (download this publication)
  • 108. Albert J.P. Theuwissen : “Colour Processing Pipeline”, invited talk at the 2007 International Image Sensor Workshop, June 7-10, 2007, Ogunquit (Maine).
  • 107. Padmakumar Rao, Xinyang Wang, Albert J.P. Theuwissen : “Radiation Hardness of Deep-Submicron CMOS Technology Evaluated by Gated-Diode Measurements”, poster at Sense of Contact, April 4th, 2007, Zeist (Netherlands).
  • 106. Xinyang Wang, Padmakumar Rao, Albert J.P. Theuwissen : “Noise in Deep Sub-Micron CMOS Image Sensors”, poster at Sense of Contact, April 4th, 2007, Zeist (Netherlands).
  • 105. Albert J.P. Theuwissen : “CMOS Image Sensors”, keynote speech at Sense of Contact, April 4th, 2007, Zeist (Netherlands).
  • 104. M.F. Snoeij, P. Donegan, A.J.P. Theuwissen, K.A.A. Makinwa, J.H. Huijsing : “A CMOS Image Sensor with a Column-Level Multiple-Ramp Single-Slope ADC”, ISSCC, San Francisco, Digest Tech. Papers, p. 506-507, Febr. 11-15, 2007. (download this publication)
  • 103. Xinyang Wang, Padmakumar R. Rao, Adri Mierop, Albert J.P. Theuwissen : “Random Telegraph Signal in CMOS Image Sensor Pixels”, Technical Digest IEDM, San Francisco, pp. 115-118, 2006. (download this publication)
  • 102. M.F. Snoeij, A.J.P. Theuwissen, K.A.A. Makinwa, J.H. Huijsing : “A CMOS Imager with Column-Level ASC Using Dynamic Column Fixed-Pattern Noise Reduction”, IEEE Journal of Solid-State Circuits, Vol. 41, no. 12, pp. 3007-3015, 2006. (download this publication)
  • 101. A.J.P. Theuwissen : “The Hole Role in Solid-State Imagers”, IEEE Transac. Electron Devices, Vol. ED-53, no. 12, pp. 2972-2980, 2006. (download this publication)
  • 100. Albert Theuwissen : “Influence of Terrestrial Cosmic Rays on the Reliability of CCD Image Sensors”, invited tutorial at IEEE Intern. Integrated Reliability Workshop, South Lake Tahoe (CA), Oct. 16-19, 2006.
  • 99. Albert Theuwissen : “Photographing Mars : Technology and Photographs”, invited Luncheon speech, IEEE Bipolar/BiCMOS Circuits and Technology Meeting, Maastricht, Oct. 9th, 2006.
  • 98. Johan Leijtens, Albert Theuwissen, Pierre Magnan : “Smart FPA’s : Are They Worth The Effort ?”, SPIE Conference, Stockholm, Sept. 13th, 2006. (download this publication)
  • 97. Jan T. Bosiers, Inge M. Peters, Cees Draijer, Albert Theuwissen : “Technical Challenges and Recent Progress in CCD Imagers”, Nuclear Inst. And Methods in Physics Research A, Sept. 2006, pp. 148-156. (download this publication)
  • 96. Martijn Snoeij, Albert Theuwissen, Kofi Makinwa, Johan Huijsing : “Column-Parallel Single-Slope ADCs for CMOS Image Sensors”, invited key-note speech, Eurosensors, Gothenburg, Sweden, Sept. 2006. (download this publication)
  • 95. Xinyang Wang, Padmakumar Rao, Albert Theuwissen : “Fixed-Pattern Noise Induced by Transmission Gate in Pinned 4T CMOS Image Sensor Pixels”, ESSDERC, Montreux, Switzerland, 2006. (download this publication)
  • 94. Albert Theuwissen : “The Hole Role”, Invited talk at the 3rd Fraunhofer CMOS Image Sensor Workshop, May 16-17, 2006, Duisburg (Germany).
  • 93. Albert Theuwissen : “Influence of Terrestrial Cosmic Rays on Solid-State Image Sensors”, Spektrum Forum, April 21, 2006, Fachhochschule, Koeln.
  • 92. M.F. Snoeij, A. Theuwissen, K. Makinwa, J.H. Huijsing : “A CMOS Imager with Column-Level ADC Using Dynamic Column FPN Reduction“, ISSCC, San Francisco, Digest Tech. Papers, p. 498-499, Febr. 5-9, 2006. (download this publication)
  • 91. Albert J.P. Theuwissen, Martijn F. Snoeij, X. Wang, Padmakumar R. Rao, and Erik Bodegom : “CMOS Image Sensors For Ambient Intelligence”, as a chapter in : “Hardware Technology Drivers of Ambient Intelligence”, edited by S. Mukherjee, 2006, pp. 125-150. (download this publication)
  • 90. Albert J.P. Theuwissen : “Influence of Terrestrial Cosmic Rays on the Reliability of CCD Imagers”, IEDM 05, Washington DC, Techn. Dig., 2005. (download this publication)
  • 89. Albert J.P. Theuwissen, Jan T.J. Bosiers, Edwin Roks : “The Hole Role”, Invited paper at IEDM 05, Washington DC, Techn. Dig., 2005. (download this publication)
  • 88. Davies William de Lima Monteiro, Thomas Nirmaier, Gleb V. Vdovin and Albert J.P. Theuwissen : “Fast Hartmann-Shack Wavefront Sensors Manufactured in Standard CMOS Technology”, IEEE Sensors Journal, Vol. 5, Oct. 2005, pp. 976-982. (download this publication)
  • 87. Jan T. Bosiers, Inge Peters, Cees Draijer, Albert Theuwissen : “Overview : Technical Challenges and Recent Progress in CCD Imagers”, Invited Paper at Pixel2005 Workshop, Bonn, Sept. 5-8, 2005. (download this publication)
  • 86. Xinyang Wang, Padmakumar R. Rao, Erik Bodegom, Albert J.P. Theuwissen : “Characterization of surface and buried channel MOSFET as in-pixel amplifier in CMOS image sensors”, 2005 Micro Nano Breakthrough Conference, July 25-28, Portland State Univ., Portland, Oregon.
  • 85. M.F. Snoeij, A.P. van der Wel, A.J.P. Theuwissen, J.H. Huijsing : “The Effect of Switched-Biasing on 1/f Noise in CMOS Imager Front-Ends”, IEEE Workshop on CCDs and Advanced Image Sensors, Karuizawa, June 9-11, 2005. (download this publication)
  • 84. M.F. Snoeij, A.J.P. Theuwissen, J.H.Huising : “A Low-Power Column-Parallel 12-bit ADC for CMOS Imagers”, IEEE Workshop on CCDs and Advanced Image Sensors, Karuizawa, June 9-11, 2005. (download this publication)
  • 83. M.F. Snoeij, A.J.P. Theuwissen, J.H. Huijsing : “A 1.8 V 3.2 µW Comparator for Use in a CMOS Imager Column-Level Single-Slope ADC”, ISCAS2005, Kobe, May 2005. (download this publication)
  • 82. Albert J.P. Theuwissen : “Image Sensors for Ambient Intelligence Applications”, Invited talk at Philips Symposium on Hardware Drivers for Ambient Intelligence, Dec. 9-10, 2004, Veldhoven (the Netherlands).
  • 81. Albert J.P. Theuwissen : “Image Processing Chain in a Digital Still Camera”, Invited plenary talk at IEEE Symposium on VLSI Circuits, Honolulu (HA), June 17-19, 2004. (download this publication)
  • 80. Albert J.P. Theuwissen : “Photography on Mars”, Journée d’Etudes Les capteurs d’images CCD-CMOS Etat de l’Art, Paris (France), June 4, 2004.
  • 79. Albert J.P. Theuwissen : “Characteristics of CMOS Image Sensors”, Invited talk at the 2nd Fraunhofer CMOS Image Sensor Workshop, May 25-26, 2004, Duisburg (Germany).
  • 78. Albert J.P. Theuwissen : “Photography on Mars”, Invited opening talk at North American Photography Festival “Contact”, May 1, 2004, Toronto (ON).
  • 77. Anthony A. Tanbakuchi, Arjen van der Sijde, Bart Dillen, Albert Theuwissen, Wim de Haan : “Adaptive Pixel Defect Correction”, poster at the University of Arizona Annual Photonics and Imaging Initiative Workshop, Marriott Hotel Tucson (AR), Jan. 21-23, 2004. (download this publication)
  • 76. Albert Theuwissen, John Coghill, Lucian Ion, Felicia Shu, Harald Siefken, Charles Smith : "Ultra-high Resolution Image Capturing and Processing for Digital Cinematography", ISSCC, San Francisco, Digest Tech. Papers, p.162-163, Febr. 9-13, 2003. (download this publication)
  • 75. J.T. Bosiers, B.G.M. Dillen, C. Draijer, A.C. Kleimann, F.J. Polderdijk, M.A.R.C. de Wolf, W. Klaassens, A.J.P. Theuwissen, H.L. Peek, H.O. Folkerts : "A 35 mm Format 11 M Pixel Full-Frame CCD for Professional Digital Still Imaging", IEEE Transac. Electron Devices, Vol. 50, No. 1, Jan. 2003, p. 254-265. (download this publication)
  • 74. T.G. Etoh, D. Poggemann, G. Kreider, H. Mutoh, A.J.P. Theuwissen, A. Ruckelshausen, Y. Kondo, H. Maruno, K. Takubo, H. Soya, K. Takehara, T. Okinaka, Y. Takano : "An Image Sensor Which Captures 100 Consecutive Frames at 1,000,000 Frames/s", IEEE Transac. Electron Devices, Vol. 50, No. 1, Jan. 2003, p. 144-151. (download this publication)
  • 73. N.V. Loukianova, H.O. Folkerts, J.P.V. Maas, D.W.E. Verbugt, A.J. Mierop, W. Hoekstra, E. Roks, A.J.P. Theuwissen : "Leakage Current Modeling of Test Structures for Characterization of Dark Current in CMOS Image Sensors", IEEE Transac. Electron Devices, Vol. 50, No. 1, Jan. 2003, p. 77-83. (download this publication)
  • 72. A. Tanbakuchi, A. van der Sijde, B. Dillen, A. Theuwissen, W. de Haan : “Adaptive Pixel Defect Correction”, Proceedings of SPIE, Vol. 5017, p. 360-370, Santa Clara, Jan. 21-23, 2003. (download this publication)
  • 71. D. Poggemann, T.G. Etoh, A. Ruckelshausen, A. Theuwissen, J. Bosiers, H. Mutoh, Y. Kondo : “Simulation-based development and characterization of a CCD architecture for 1 million frames per second”, Proceedings of SPIE, Vol. 5017, p. 185-195, Santa Clara, Jan. 21-23, 2003.
  • 70. M.F. Snoeij, A.J.P. Theuwissen and J.H. Huijsing : “Read-Out Circuits for Reduction of Fixed-Pattern Noise in a CMOS Active Pixel Sensor”, Proc. of the Semiconductor Sensors Conference SeSENS, Veldhoven (Nl), pp. 676-679, Nov. 2002. (download this publication)
  • 69. Albert Theuwissen : “CCD Developments”, 3. Z/I Imaging Recce-Workshop, June 11-13, 2002, Oberkochen (Germany).
  • 68. Albert J.P. Theuwissen : “Effect of shrinking pixels in solid-state image sensors”, Journee d’Etudes – Les capteurs d’images CCD-CMOS Etat de l’Art, Paris (France), June 10, 2002.
  • 67. Albert J.P. Theuwissen : “Small is Beautiful ?! Yes, but not for pixels of solid-state imagers.”, Invited talk at the 1st Fraunhofer CMOS Image Sensor Workshop, May 6-7, 2002, Duisburg (Germany).
  • 66. Albert J.P. Theuwissen : “Small is Beautiful ?! Yes, but not for pixels of solid-state imagers”, Invited talk at the PICS Conference, Conf. Proc., p. 156-157, April 7-10, 2002, Portland (OR).
  • 65. J.T. Bosiers, A.C. Kleimann, H.C. van Kuijk, L. Le Cam, H. Peek, J. Maas, A.J.P. Theuwissen : “Frame Transfer CCDs for Digital Still Cameras : Concept, Design and Evaluation”, IEEE Transac. Electron Devices, Vol. 49, p. 377-386, 2002. (download this publication)
  • 64. T.G. Etoh, D. Poggemann, A. Ruckelshausen, A. Theuwissen, G. Kreider, H.-O. Folkerts, H. Mutoh, Y. Kondo, H. Maruno, K. Takubo, H. Soya, K. Takehara, T. Okinaka, Y. Takano, T. Reisinger, C. Lohmann : “A CCD Image Sensor of 1M frames/s for Continuous Image Capturing of >100 Frames.”, ISSCC, San Francisco, Digest Techn. Papers, p. 46-47, Febr. 4-6, 2002. (download this publication)
  • 63. L. Le Cam, J. Bosiers, A. Kleimann, H. van Kuijk, J. Maas, M. Beenhakkers, H. Peek, P. van der Rijt, A. Theuwissen : “A 1/1.8” 3M-pixel FT-CCD with On-Chip Horizontal Sub-Sampling for DSC Applications”, ISSCC, San Francisco, Digest Tech. Papers, p. 34-35, Febr. 4-6, 2002. (download this publication)
  • 62. Albert Theuwissen : “Solid-State Imaging Devices”, contribution to Encyclopedia of Physical Science and Technology, third edition, Academic Press, 2001.
  • 61. D. Poggemann, T.G. Etoh, A. Ruckelshausen, G. Kreider, A. Theuwissen, Y. Kondo, H. Maruno, K. Takubo, H. Soya : “An Ultra-High-Speed Camera with an In-situ Storage Image Sensor for Preliminary Test”, 1999 IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors, Lake Tahoe, June 7-9, 2001. (download this publication)
  • 60. C. Draijer, G. Kreider, B. Dillen, W. Klaassens, H. Peek, A. Theuwissen : “A Color Image Sensor with 9 µm Pixels for High-End Digital Still Photography”, 1999 IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors, Lake Tahoe, June 7-9, 2001. (download this publication)
  • 59. Albert J.P. Theuwissen : “CMOS or CCD image sensors for digital still applications ?”, invited paper, Proc. VLSI-TSA Symposium, Hsinchu (Taiwan), April 18-20, 2001, pp. 168-171. (download this publication) (download this presentation)
  • 58. Albert J.P. Theuwissen : “What you see is what you get ?!”, Seybold seminar, April 12, 2001, Boston. (download this presentation)
  • 57. Albert Theuwissen and Edwin Roks : “Building a better mousetrap, modified CMOS processes improve image sensor performance”, OE Magazine, Jan. 2001, pp. 29-32. (download this publication)
  • 56. Albert Theuwissen : “For Pixels, Size Matters”, Photonics Spectra, August 2000, pp. 112-113.
  • 55. A.J.P. Theuwissen : “Solid-State Image Sensors for Digital Photography”, 6th October, 1999, VDI-Vortrag, Koln.
  • 54. A.J.P. Theuwissen : “CMOS or CCD image sensors for digital still applications ?”, invited paper ESSCIRC, Duisburg, 21-23 Sept. 1999, p. 28. (download this publication) (download this presentation)
  • 53. H.-S. Philip Wong and Albert J.P. Theuwissen : “Guest Editor’s Introduction : Digital Imaging”, IEEE Micro, Vol.18, 1998, no. 6, pp.12-13. (download this publication)
  • 52. Albert Theuwissen : “Update on today’s CCD technology”, BIVA meeting on “CMOS image sensors, technology and applications”, 26th May, 1999, Stuttgart, Germany, UK.
  • 51. Albert J.P. Theuwissen : “Professional digital photography : state-of-the-art”, Seybold seminars, March 2-5, 1999, Boston.
  • 50. Albert Theuwissen : “Update on today’s CCD technology”, Europractice “CMOS image sensors, technology and applications”, 30th September, 1998, Stuttgart, Germany, UK.
  • 49. Albert Theuwissen : “Update on today’s CCD technology”, Europractice “CMOS image sensors, technology and applications”, 16th September, 1998, Southampton, UK.
  • 48. Albert J.P. Theuwissen : “Solid-state Imaging Devices for Digital Photography”, ICPS, Sept. 7-11, 1998, Antwerp, pp. 326-329.
  • 47. A. Theuwissen : “Versatile building-block architecture for large area, high performance CCD imagers”, (invited paper) Proceedings ESSDERC’98, Bordeaux (Fr), Sept. 8-10, 1998, pp. 56-61. (download this publication)
  • 46. A.J.P. Theuwissen : moderator of the ISSCC Evening Panel Discussion on “Will CMOS Image Sensors Survive Scaling ?”, San Francisco (CA), Feb. 5-7, 1998.
  • 45. A. Theuwissen, M. Beenhakkers, B. Dillen, H.O. Folkerts, H. Heyns, L. Korthout, G. Kreider, P. Opmeer, H. Peek, E. Roks, H. Rosner, A. van der Sijde, F. Vledder : “Versatile building-block architecture for large area, high performance CCD imagers”, Proceedings of SPIE, Vol. 3301, pp. 37-43, San Jose, Jan. 26-27, 1998. (download this publication)
  • 44. A.J.P. Theuwissen : “Dynamic Range : Buyers Need Comparable Specifications”, Photonics Spectra, November 1997, p. 161-163. (download this publication)
  • 43. M. Lesser, D. Ouellette, A. Theuwissen, G. Kreider, H. Michaelis : “Packaging and operation of Philips 7K x 9K CCDs”, 1997 IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors, Bruges, June 5-7, 1997. (download this publication)
  • 42. H. Folkerts, E. Roks, L. Korthout, A. Theuwissen : “Characterization of building block imagers with respect to linear dynamic range”, 1997 IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors, Bruges, June 5-7, 1997. (download this publication)
  • 41. A. Theuwissen : “Image Sensing for Electronic Photography”, 7. SGOEM Fachkurs Bildgebende Optische Messtechnik 1997, 10-14 March, Engelberg (CH).
  • 40. A. Theuwissen : “State-of-the-art and future developments in CCD image sensors”, 7. SGOEM Fachkurs Bildgebende Optische Messtechnik 1997, 10-14 March, Engelberg (CH).
  • 39. A. Theuwissen : “Modular CCDs”, Photonics Spectra, Jan. 1997, p. 110-112.
  • 38. H. Stoldt, A.J.P. Theuwissen, F.F. Vledder, P.G.M. Centen, A. Mierop, A.C.M. Kleimann, H.L. Peek, D.W.E. Verbugt, P.B. Hartog, R.H.S. de Gruyter : “CCD Imagers for Broadcast Applications” (invited paper), IEDM 96, San Francisco, Dig. Techn. Papers, 1996. (download this publication)
  • 37. A. Theuwissen : “Modular CCD concept for large area CCD imagers”, ESO Workshop Optical detectors for Astronomy, 8-10 October, 1996, Proceedings pp. 37-44, Kluwer Acad. Publ., 1998.
  • 36. A. Theuwissen : "Large area imagers for Digital Photography", (invited paper) Intern. Symp. on Electr. Photography, Koln (Germ.), 21-22 Sept. 1996.
  • 35. G. Kreider, J. Bosiers, B. Dillen, J. Van der Heijden, W. Hoekstra, A. Kleimann, P. Opmeer, J. Oppers, H. Peek, R. Pellens, A. Theuwissen : “An mK x nK Modular Image Sensor Design”, IEDM 95, Washington DC, Dig. Techn. Papers, p. 155-158, 1995. (download this publication)
  • 34. P. Centen, A. Mierop, H. Stoldt, A. Theuwissen, G. Pine, M. Stekelenburg : "Dynamic Pixel Management for second generation aspect ratio switching", 19th Intern. Television Symposium and Technical Exhibition, Montreux, June 8-13, 1995, pp. 99-106. (download this publication)
  • 33. E. Roks, A. Theuwissen, H. Peek, M. van de Steeg, P. Centen, J. Bosiers, D. Verbugt, E. de Koning : "A low noise, highly sensitive 1", 2.2 Mpixel FT CCD imager for high definition applications", 1995 IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors, Dana Point, April 20-22, 1995. (download this publication)
  • 32. A. Theuwissen, J. Bosiers : "Consumer CCDs : masterpieces of 3D integration", Optics & Photonics News, April 1995, pp. 32-36. (download this publication)
  • 31. A.J.P. Theuwissen : “Solid-State Imaging with Charge-Coupled Devices”, Kluwer Acad. Publishers, Dordrecht, ISBN 079-233456-6, April 1995.
  • 30. A. Theuwissen : “Broadcast CCD Imagers find new Applications”, Photonics Spectra, Jan. 1995, p. 109.
  • 29. A. Theuwissen, J. Bosiers, H. Heijns, G. Kreider, H. Peek, E. Roks, C. Schaeffer, H. Stoldt : "Real time imaging with mega pixel charge coupled devices.", Proc. Intelligent Robots and Computer Vision XIII : 3D Vision, Product Inspection, and Active Vision, SPIE Vol. 2354, Boston, 2-4 Nov. 1994, pp.240-248. (download this publication)
  • 28. A.J.P. Theuwissen : "Die leise Revolution der sehenden Chips", Bulletin VSE UCS, No. 21, 1994, p. 19-23.
  • 27. P. Centen, H. Stoldt, A. Theuwissen, H. Peek, W. Huinink, L. Sankaranarayanan, A. Kleimann, G. Pine, M. Stekelenburg, A. Mierop, F. Vledder, D. Verbugt, J. Oppers, P. Opmeer : "Aspect ratio switching with equal horizontal pixel count.", Intern. Broadcast Convention, Amsterdam, Techn. Papers, p. 1-7, September 1994. (download this publication)
  • 26. A. Theuwissen : "CCD Imaging", Philips Journal of Research, Vol. 48, No. 3, p.147-158, 1994. (download this publication)
  • 25. A. Theuwissen : "CCD Imaging", Sensor Technology 1994, University of Twente, conference proceedings, p. 51-66, 1994.
  • 24. H. Peek, A. Theuwissen, A. Kokshoorn, E. Daemen : "Groove fill of tungsten and poly Si membrane technology for high performance (HDTV) FT CCD imagers.", IEDM 93, Washington DC, Techn. Dig. p. 567-570, 1993. (download this publication)
  • 23. L.J.M. Esser, A.J.P. Theuwissen : "Charge Coupled Devices : Physics, Technology and Imaging", in "Handbook on Semiconductors" ed. by T.S. Moss, Vol.4, ed. by C. Hilsum, Elsevier Science Publ., 1993, p. 389-473.
  • 22. A.J.P. Theuwissen, H.L. Peek, M.J.H. van de Steeg, R.M.G. Boesten, P.B. Hartog, A.L. Kokshoorn, E.A. de Koning, J.M.A.M. Oppers, F.F. Vledder, P.G.M. Centen, H. Blom, W. Haar : "A 2.2M Pixel FT CCD Imager According to the Eureka HDTV Standard.", IEEE Transac. Electron Devices, Vol. 40, No. 9, Sept. 1993, p. 1621-1629. (download this publication)
  • 21. J. Blankevoort, H. Blom, P. Brouwer, B. van de Herik, R. Koppe, A. Moelands, J. van Rooy, F. Stok, A. Theuwissen : "A high performance, full bandwidth, HDTV camera, applying the first 2.2 million pixel Frame Transfer CCD sensor.", 134th SMPTE Techn. Conf., Toronto (Can), Nov. 10-13, 1992.
  • 20. M. van de Steeg, R. Boesten, P. Centen, P. Hartog, A. Kokshoorn, E. de Koning, J. Oppers, H. Peek, A. Theuwissen, F. Vledder : "CCD Imagers for HDTV.", "Imaging the Future", Cambridge (UK), 22-25 Sept., 1992. Also The Journal of Photographic Science, Vol. 41, No. 3, 1993, p. 117-118.
  • 19. A. Theuwissen : "HDTV image sensors.", (invited paper) IS&T Proceedings of the Intern. Symp. on Electr. Photography, Koln (Germ.), Sept. 1992, p. 12-16. (download this publication)
  • 18. A. Theuwissen, H. Peek, P. Centen, M. van de Steeg, R. Boesten, P. Hartog, A. Kokshoorn, E. de Koning, J. Oppers, F. Vledder : "HDTV image sensor : the pixel structure.", Intern. Broadcast Convention, Amsterdam, Techn. Papers, p. 488-491, July 1992. (download this publication)
  • 17. Theuwissen, H. Peek, P. Centen, R. Boesten, J. Cox, P. Hartog, A. Kokshoorn, H. van Kuijk, B. O'Dwyer, J. Oppers, F. Vledder : "A 2.2 Mpixel FT CCD imager according to the Eureka HDTV standard.", IEDM 91, Washington DC, Techn. Dig. p. 167-170, 1991. (download this publication)
  • 16. J.G.C. Bakker, L.J.M. Esser, H.L. Peek, C.J. Sweeney, A.L. Kokshoorn, A.J.P. Theuwissen : "The Tacking CCD : A new CCD concept.", IEEE Transac. Electr. Dev., Vol. ED 38, p. 1193-1200, May 1991. (download this publication)
  • 15. A.J.P. Theuwissen : "Charge Coupled Devices als Bildaufnehmer", Elektronik, No. 23, p. 76-84, 1990. (download this publication)
  • 14. A.J.P. Theuwissen : "CCD imagers for HDTV", Workshop on Advanced Solid State Imagers, Harriman (NY), May 18-20, 1990. (download this publication)
  • 13. A.J.P. Theuwissen : "Recente Ontwikkelingen op het gebied van CCD imagers", MediAVisie, Amsterdam, 18-21 sept., 1989.
  • 12. L.J.M. Esser, H.C.G. van Kuijk. J.G.C. Bakker, C.H.L. Weijtens, A.J.P. Theuwissen : "A Smearfree Accordion CCD Imager", Intern. Conf. Consumer Electronics, Rosemont, p.10-11, June 8-10, 1988. (download this publication)
  • 11. A.J.P. Theuwissen, J.G.C. Bakker, J.N.G. Cox, A.L. Kokshoorn, P.A.C. van Loon, B.C.J. O'Dwyer, J.M.A.M. Oppers, C.H.L. Weijtens : "A 400k pixel 1/2" Accordion CCD Imager", ISSCC, San Francisco, Digest Tech. Papers, p.48-49, Febr. 17-19, 1988. (download this publication)
  • 10. A.J.P. Theuwissen, C.H.L. Weijtens : "The accordion imager, a new solid state image sensor", Philips Technical Review, Vol.43, p.1-8, 1986. (download this publication)
  • 9. A. Theuwissen : "The Accordion Imager", Proc. Intern. Congress of Photographic Science : Progress in Basic Principles of Imaging Systems, Koln, p.638, Sept. 10 17, 1986.
  • 8. A.J.P. Theuwissen, C.H.L. Weijtens, J.N.G. Cox : "The Accordion Imager : more than just a CCD sensor", Electronic Imaging '85, Boston, p.87-90, Oct. 7-10, 1985. (download this publication)
  • 7. M.G. Collet, J.G.C. Bakker, L.J.M. Esser, H.L. Peek, M.J.H. van de Steeg, A.J.P. Theuwissen, C.H.L. Weijtens : "High Density Frame Transfer Image Sensors with Vertical Anti Blooming", SPIE Vol. 570 Solid State Imaging Arrays, San Diego, p.27-34, 1985. (download this publication)
  • 6. A.J.P. Theuwissen, C.H.L. Weijtens, L.J.M. Esser, J.N.G. Cox, H.T.A.R. Duyvelaar, W.C. Keur : "The Accordion Imager : an ultra high density Frame Transfer CCD", IEDM 84, San Francisco, Techn. Dig. p.40-43, 1984. (download this publication)
  • 5. J. van der Spiegel, J. Sevenhans, A. Theuwissen, J. Bosiers, I. Debusschere, G. Declerck : "Study of different sensor types for high resolution linear CCD imagers", Sensors and Actuators, Vol. 6, p.51-64, 1984. (download this publication)
  • 4. A.J.P. Theuwissen, G. Declerck : "Optical and Electrical Properties of Reactively DC Magnetron Sputtered In2O3:Sn Films", Thin Solid Films, Vol. 121, p.109-119, 1984. (download this publication)
  • 3. A. Theuwissen, G. Declerck : "Linear CCD imagers with a Poly imide Insulation for Double Level Metallization", IEEE Electr. Dev. Lett., Vol. EDL 3, p.308-309, 1982. (download this publication)
  • 2. A. Theuwissen, G. Declerck : "Technology of CCD imagers with transparent conductive ITO electrodes", 10th ESSDERC/5th SSSDT, York (UK), Conf. Abstr. p.216-217, Sept. 15-18, 1980. (download this publication)
  • 1. A. Theuwissen, A. Vits, J.P. Vermeiren : "Analysis of traffic flow with a CCD camera and a micro processor", Journal A, Vol. 21, no. 3, p.112-115, 1980. (download this publication)
Home Video on Demand Courses Technical Projects About Blog Contact

Copyright © 2024 Harvest Imaging - All rights reserved - Legal Disclaimer