Harvest Imaging Forum 2017

Together with the speaker/presentater/instructor Christian Enz (EPFL), the final agenda for the Harvest Imaging Forum 2017 on “Noise in Analog Devices and Circuits” is defined.¬† I am happy to share it with you :

9:00 – 9:15 Introduction to the forum
9:15 – 10:45 Introduction, Random signals and noise, Main noise sources of circuit components, Noise models of basic components
10:45 – 11:15 Break
11:15 – 12:45 Noise Calculations in Circuits, Noise calculation in continuous-time (CT) circuits, Noise sampling
12:45 – 14:00 Lunch break
14:00 – 15:30 Noise calculation in switched-capacitor (SC) circuits, Noise simulation
15:30 – 16:00 Break
16:00 – 17:30 Trade-offs between Noise and Power Consumption, The simplified EKV MOS transistor model
19:00 – 20:30 Dinner
9:00 Р10:30 The simplified EKV MOS transistor model, The concept of inversion coefficient and the  design methodology, Basic trade-offs in analog design
10:30 – 11:00 Break
11:00 – 12:30 Figures-of-merit (FoMs) as design guidelines, Key FoMs parameters extraction
12:30 – 13:45 Lunch break
13:45 – 15:15 Noise and Offset Reduction Techniques, Switch nonidealities, The Autozero (AZ) technique, The Chopper Stabilization (CS) technique, Recent trends in noise and offset reduction techniques
15:15 – 15:45 Break
15:45 – 17:15 Example of a Low-noise CMOS Imager, CMOS image sensors (CIS), Noise reduction in CIS, A sub 0.5erms noise VGA imager in standard CMOS, Future improvements
17:15 – 17:30 Closure of the forum

Looks more than appealing !!

All further info about the Harvest Imaging Forum 2017 can be found here.

Albert, 25-11-2017.

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