REPRODUCIBILITY, VARIABILITY, RELIABILITY of CMOS Image Sensors

After the successful Harvest Imaging project on Phase-Detection Auto-Focus pixels (or PDAF), a new project is started that again will generate technical data about CMOS image sensors.  This time the focus will be put on the reproducibilityvariability and reliability of the sensor’s performance characteristics.  This kind of information has never been published before.  None of the CMOS image sensor vendors is supplying numerical information about reproducibilityvariability and reliability of their devices.  So if the vendors do not supply this data, only measurements on existing products can reveal the “secrets”.

Within a couple of weeks from now  more information on the tests performed as well as information on the parameters characterized will become available on this website of Harvest Imaging (www.harvestimaging.com).

So stay tuned !!!

Albert, 13-04-2017.

2 Responses to “REPRODUCIBILITY, VARIABILITY, RELIABILITY of CMOS Image Sensors”

  1. Mario Sormann says:

    Looking forward to it!

  2. […] Albert Theuwissen has a unique experience with image sensor statistics and their parameters changing over time when his students run through the same devices characterization, course after course, year after year. So, he came up with a brilliant idea to present his knowledge in a report on CMOS sensors reproducibility, variability, and reliability. The first info about the report is expected to be available in a few weeks. Image Sensors World […]

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