After the successful Harvest Imaging project on Phase-Detection Auto-Focus pixels (or PDAF), a new project is started that again will generate technical data about CMOS image sensors. This time the focus will be put on the reproducibility, variability and reliability of the sensor’s performance characteristics. This kind of information has never been published before. None of the CMOS image sensor vendors is supplying numerical information about reproducibility, variability and reliability of their devices. So if the vendors do not supply this data, only measurements on existing products can reveal the “secrets”.
Within a couple of weeks from now more information on the tests performed as well as information on the parameters characterized will become available on this website of Harvest Imaging (www.harvestimaging.com).
So stay tuned !!!