Archive for July, 2014

Additional Session for the Solid-State Imaging Forum

Friday, July 25th, 2014

Is it the subject of the forum that makes the forum appealing, or is it the speaker that attracts the attention ?  Actually the answer to this question it not that important, I just want to mention that the first session of the forum is nearly sold out, and that is a good reason to organize a second session.  Same location, same speaker, same content, only a different date of course.  The second session is scheduled for DECEMBER 15TH AND 16TH, 2014.

More information can be found on

Albert, 25-7-2014.

Second Solid-State Imaging Forum open for registration

Tuesday, July 15th, 2014

Hello everyone,

All organizational and logistics details are settled, so I can open the registration for the second Solid-State Imaging Forum.  All information of the forum is shown on the website :

Please notice, like last year, I will limit the number of seats to maximum 24.  This will enhance the learning experience.  Only in the case that we get substantially more registrants than this upper limit of 24, a second session can/will be considered.  If you are interested to attend, early registration is recommended for two reasons :

1) for you : to make sure you get a seat (first come, first serve),

2) for me : to get as early as possible an idea whether a second session is needed or not.  (A scond session  can not be organized just a few weeks before the event will take place,)

Thanks, and looking forward to see you at the forum,



How to Measure Modulation Transfer Function (5)

Friday, July 4th, 2014

In the last blog the MTF measurement based on the slanted edge was introduced.  As mentioned in that blog, to understand all ins and outs of the method, it is very beneficial to develop a small, simple model of the sensor with a slanted edge projected on it.  And next, analyze the obtained, synthesized image.  This simulation tool is also used here to check out the sensitivity of the technique w.r.t. the angle of the slanted edge.

The result is shown in Figure 1.

Figure 1 : Effect of the slanted edge angle on the accuracy of the evaluation technique to characterize the MTF.

Shown are the MTF results obtained for a simulation of the angle being equal to 2 deg., 4 deg., 6 deg., 8 deg., 10 deg. and 12 deg.  The ideal curve, obtained by the calculation of the sinc-function, is included as well.  As can be seen from the curve :

  • All evaluations based on an angle between 2 deg. and 10 deg. seem to fit very well to the ideal curve,
  • The simulation result for an angle of 12 deg. shows some minor deviations from the ideal curve.

As a message from this simulation : angles of the slanted edge between 2 deg. and 10 deg. are very well suited for the MTF analysis.  Once the angle is larger than 10 deg., the slanted edge method starts loosing its accuracy.  The simulation results obtained here are fully in line with the advice of the ISO standard, which suggests also to use an angle of the slanted edge between 2 deg. and 10 deg.

Next time : how to implement oversampling and how to avoid aliasing effects during the measurements.

Albert, 04-07-2014.