Comments for Harvest Imaging Blog http://harvestimaging.com/blog Sun, 07 Apr 2013 02:00:17 +0000 hourly 1 http://wordpress.org/?v=3.3.2 Comment on Announcement of FIRST IMAGING FORUM, Dec. 16th-17th, 2013. by Dan McGrath http://harvestimaging.com/blog/?p=1135&cpage=1#comment-76197 Dan McGrath Sun, 07 Apr 2013 02:00:17 +0000 http://harvestimaging.com/blog/?p=1135#comment-76197 I understand. Thanks for the clarification. Dan I understand. Thanks for the clarification. Dan

]]> Comment on Announcement of FIRST IMAGING FORUM, Dec. 16th-17th, 2013. by albert http://harvestimaging.com/blog/?p=1135&cpage=1#comment-76175 albert Sat, 06 Apr 2013 15:23:27 +0000 http://harvestimaging.com/blog/?p=1135#comment-76175 Dan, this is NOT another conference, it is a kind of short course. And in the case that the first forum is sold out, we always have the option to run it a second time, and if the second time is sold out, we can run it a third time. Dan, this is NOT another conference, it is a kind of short course. And in the case that the first forum is sold out, we always have the option to run it a second time, and if the second time is sold out, we can run it a third time.

]]> Comment on Announcement of FIRST IMAGING FORUM, Dec. 16th-17th, 2013. by Dan McGrath http://harvestimaging.com/blog/?p=1135&cpage=1#comment-76170 Dan McGrath Sat, 06 Apr 2013 13:28:52 +0000 http://harvestimaging.com/blog/?p=1135#comment-76170 A complaint of the image sensor workshop is that it is too inclusive -- at 140 attendees it is too small to include the engineers in the trenches and the engineers that have a toe (or would might be inclined to have a toe) in image sensors. The fresh blood. That it does not provide the right link of experience with potential to keep the technology healthy. This proposal goes the wrong way to address this problem. It also almost feels like a collusion or a cabal -- the godfathers gathering in a smoky back room and thinking that they have all knowledge needed. A complaint of the image sensor workshop is that it is too inclusive — at 140 attendees it is too small to include the engineers in the trenches and the engineers that have a toe (or would might be inclined to have a toe) in image sensors. The fresh blood. That it does not provide the right link of experience with potential to keep the technology healthy. This proposal goes the wrong way to address this problem. It also almost feels like a collusion or a cabal — the godfathers gathering in a smoky back room and thinking that they have all knowledge needed.

]]> Comment on International Solid-State Circuits Conference 2013 (2) by Adi http://harvestimaging.com/blog/?p=1117&cpage=1#comment-74335 Adi Fri, 22 Feb 2013 14:26:47 +0000 http://harvestimaging.com/blog/?p=1117#comment-74335 Dear Albert, thank you for sharing this nice report! Regarding the Olimpus work: I see that they use a global reset but different transfer gate timing for the 4 pixels sharing the bump i.e. the fourth pixel integrates a bit longer than the first one. Did they mention how they solve this issue? Thanks! Dear Albert, thank you for sharing this nice report!
Regarding the Olimpus work: I see that they use a global reset but different transfer gate timing for the 4 pixels sharing the bump i.e. the fourth pixel integrates a bit longer than the first one. Did they mention how they solve this issue?
Thanks!

]]> Comment on How To Measure Dead Pixels ? by Venkat http://harvestimaging.com/blog/?p=1074&cpage=1#comment-72986 Venkat Tue, 22 Jan 2013 17:29:26 +0000 http://harvestimaging.com/blog/?p=1074#comment-72986 Albert, A White Pixel is due to the saturated dark currents, which is again due to the presence defects (metal contamination) in the photodiode region. What kind of bulk/process induced metals gettering techniques that Image Sensing Manufacturers employ to lower the White Pixel counts? Can you shed light on this? Albert,
A White Pixel is due to the saturated dark currents, which is again due to the presence defects (metal contamination) in the photodiode region. What kind of bulk/process induced metals gettering techniques that Image Sensing Manufacturers employ to lower the White Pixel counts?
Can you shed light on this?

]]> Comment on How To Measure Dead Pixels ? by http://tinyurl.com/stumwelch35687 http://harvestimaging.com/blog/?p=1074&cpage=1#comment-72739 http://tinyurl.com/stumwelch35687 Wed, 16 Jan 2013 15:17:50 +0000 http://harvestimaging.com/blog/?p=1074#comment-72739 “How To Measure Dead Pixels ? ? Harvest Imaging Blog” was indeed a pretty good blog, . Continue composing and I'll try to continue reading! Regards ,Maximo “How To Measure Dead Pixels ? ? Harvest Imaging
Blog” was indeed a pretty good blog, . Continue composing and I’ll try to continue reading! Regards ,Maximo

]]> Comment on “Imaging Sensors” course at Delft University of Technology by Tom Greig http://harvestimaging.com/blog/?p=1105&cpage=1#comment-72727 Tom Greig Wed, 16 Jan 2013 11:22:31 +0000 http://harvestimaging.com/blog/?p=1105#comment-72727 Dear Albert I am glad to here this course has been a great success. I wonder if any of you Graduates would be interested in some CMOS/CCD PhD studentship vacancies we have in our group? Would it be possible to pass some details onto your graduates? Many thanks in advance Tom Greig Dear Albert

I am glad to here this course has been a great success. I wonder if any of you Graduates would be interested in some CMOS/CCD PhD studentship vacancies we have in our group?

Would it be possible to pass some details onto your graduates?

Many thanks in advance

Tom Greig

]]> Comment on How To Measure Conversion Gain ? by albert http://harvestimaging.com/blog/?p=1086&cpage=1#comment-70010 albert Fri, 16 Nov 2012 11:08:04 +0000 http://harvestimaging.com/blog/?p=1086#comment-70010 Hi, I think it is indeed an appealing idea. What could be such an award or prize ? Albert. Hi, I think it is indeed an appealing idea. What could be such an award or prize ?
Albert.

]]> Comment on How To Measure Conversion Gain ? by David San Segundo http://harvestimaging.com/blog/?p=1086&cpage=1#comment-70004 David San Segundo Fri, 16 Nov 2012 07:58:37 +0000 http://harvestimaging.com/blog/?p=1086#comment-70004 I hereby support Dr. McGrath's prize idea "for the best characterization method or the best advancement in characterization of image sensors". Best, David I hereby support Dr. McGrath’s prize idea “for the best characterization method or the best advancement in characterization of image sensors”.

Best,
David

]]> Comment on How To Measure Conversion Gain ? by Dan McGrath http://harvestimaging.com/blog/?p=1086&cpage=1#comment-69985 Dan McGrath Thu, 15 Nov 2012 16:39:52 +0000 http://harvestimaging.com/blog/?p=1086#comment-69985 Albert, It is interesting that these three methods were all in use for CCD's when I was at TI -- that means before 1986. Is it possible that characterization is dogma from the ancient times? There should be a contest for the best characterization method or the best advancement in characterization of image sensors for each year or for each two years to spur and recognize advancement. Distinguishing input-referred characterization (necessary for the designer) versus output-referred (dear to the customer) seems worth mention. For conversion gain, input-referred is directly related to capacitance while output-referred has the active FET and the signal chain. The challenge for the designer is to back out the input-referred while all that can be measured is the output-referred. Will you give a prize for a new, better way to characterize conversion gain -- a fourth way? Best, Dan Albert,

It is interesting that these three methods were all in use for CCD’s when I was at TI — that means before 1986. Is it possible that characterization is dogma from the ancient times? There should be a contest for the best characterization method or the best advancement in characterization of image sensors for each year or for each two years to spur and recognize advancement.

Distinguishing input-referred characterization (necessary for the designer) versus output-referred (dear to the customer) seems worth mention. For conversion gain, input-referred is directly related to capacitance while output-referred has the active FET and the signal chain. The challenge for the designer is to back out the input-referred while all that can be measured is the output-referred.

Will you give a prize for a new, better way to characterize conversion gain — a fourth way?

Best, Dan

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